John Mulcahy
REW Author
Thread Starter
- Joined
- Apr 3, 2017
- Posts
- 8,033
Here are those measurement-related changes I mentioned, should make things more convenient when measuring multi-channel systems.
There is a measurement mode selector for SPL measurements to choose between single, repeated or sequential channel measurement
There is a mode setup button to configure start delay, delay between measurements for repeated measurements and the channels to measure for sequential channel measurements
There is now a naming option to prefix the measurement name with the output channel
The Measure dialog now has options to reduce the sweep level by 10 dB when measuring the LFE channel and to use a different end frequency when measuring the LFE channel. For Java drivers that means the channel whose name is LFE, for ASIO drivers it is assumed to be the 4th ASIO output channel if there is no channel with LFE in the name.
Other changes:
There is a measurement mode selector for SPL measurements to choose between single, repeated or sequential channel measurement
There is a mode setup button to configure start delay, delay between measurements for repeated measurements and the channels to measure for sequential channel measurements
There is now a naming option to prefix the measurement name with the output channel
The Measure dialog now has options to reduce the sweep level by 10 dB when measuring the LFE channel and to use a different end frequency when measuring the LFE channel. For Java drivers that means the channel whose name is LFE, for ASIO drivers it is assumed to be the 4th ASIO output channel if there is no channel with LFE in the name.
Other changes:
- Added: The delay between repeated measurements is set independently of the start delay
- Changed: The Measure dialog options to invert second output, fill silence with dither and play dither before sweep have been moved into an options panel
- Fixed: The polarity of filtered data could get out of sync with the invert controls during impulse alignment